Equipment for testing and surface analysis: 2D and 3D optical profilemeters, atomic force microscope (AFM), x-ray spectroscopy system (XPS), scanning tunneling microscopy (STM) systems
X-ray (XPS) and ultra-violet (USP) spectroscopy systems in ultra high vacuum, spectroscopy systems at pressures close to the environment (NAP-XPS)
Scanning microscopy (SPM), low energy electron microscopy (LEEM), photoemission electron microscopy (PEEM)
Nanomechanical tests, 2D and 3D optical or probe profilometers, rugosimeters, reflectometers